The OVA STe
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Learn more about the OVA STe and the technology that can make your
job a lot easier.
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Luna Technologies' Optical Vector Analyzer (OVA) STe offers the same
trusted all-parameter testing capabilities
as the OVA STe, now with over 70 m of testing
length. This premium long-distance feature
allows the user to peer into the heart of a
subsystem, system, or backplane—singling
out performance of each element in the system
path. As with the OVA STe, a complete vector
model of the optical field, including polarization
state and optical phase, is used to characterize
the system under test.
MEASUREMENTS:
Insertion Loss (IL)
Return Loss (RL)
Polarization Dependent Loss (PDL)
Phase response
Group Delay (GD)
Chromatic Dispersion (CD)
Polarization Mode Dispersion (PMD)
2nd order Polarization Mode Dispersion (PMD)
Min/Max Loss due to Polarization
Impulse response
Jones matrix elements
Phase Ripple - Linear and Quadratic
ADVANTAGES:
The OVA STe offers significant advantages for optical component testing
in the following categories:
- Productivity
The OVA STe eliminates manufacturing
bottlenecks and reduces labor cost
by providing comprehensive component characterization
over 40 nm in less than 2.5 seconds.
Equivalent testing using currently
available equipment can take 10x longer.
- Capital investment reduction
The OVA STe provides comprehensive analysis
in a single instrument. There is no
need to have multiple, expensive instruments
for complete analysis.
- Ease of use
The OVA STe is fully automated, requiring
no special skills to operate. It can
be easily integrated into a manufacturing
production line.
- Space savings
The OVA STe is a single unit that fits
into one rack space, providing the
same functionality as multiple-instrument
configurations.
- Greater
Flexibility
Use the extended length capability of the STe to test devices and assemblies
like dispersion compensating modules and amplifiers with access to 70 meters
in measurement length.
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