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Support Phone: 1.866.586.2682
Fax: 1.540.961.5191
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The OVA Platform

The OVA CTe

The industry’s first completely integrated single-scan, self-calibrating solution for all-parameter characterization of passive optical components measuring up to 30 meters meters of device length.

The OVA STe

An all-parameter evaluation instrument providing a comprehensive characterization of modules and subsystems of up to 70 meters of device length.

OFDR

The OVA EL

A tool that minimizes capital outlay by providing cost-effective integration of existing equipment into this single-scan, self-calibrating system. Compatible with the Agilent 81640 (A/B) and 81600 series TLS.

The OFDR:

Upgrade your OVA to include ultra-high resolution reflectometry capability. The Optical Frequency Domain Reflectometer improves yields by seeing where designs break down. With industry-leading 20 micron resolution and with zero dead zone, the OFDR pinpoints even the smallest contributors to loss.

OVA ELp

The OVA ELp

Used to characterize the polarization and loss properties of fiber optic components for high-speed optical networks. Using an external laser, the OVA ELp is a fast, economical tool that provides industry leading accuracy and resolution in a single sweep of a tunable laser.