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The industry’s first completely integrated single-scan, self-calibrating
solution for all-parameter characterization of passive optical components
measuring up to 30 meters meters of device length. |
An all-parameter evaluation instrument providing a comprehensive characterization of modules and subsystems of up to 70 meters of device length. |
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A tool that minimizes capital outlay by providing cost-effective
integration of existing equipment
into this single-scan, self-calibrating system. Compatible with
the Agilent 81640 (A/B) and 81600 series
TLS. |
Upgrade your OVA to include ultra-high resolution reflectometry
capability. The Optical Frequency
Domain Reflectometer improves yields
by seeing where designs break down.
With industry-leading 20 micron
resolution and with zero dead zone, the OFDR pinpoints even
the smallest contributors to loss. |
