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LEARN MORE Learn more about the OVA EL and the technology that can make your job a lot easier. APPLICATIONS PRICING DATA SHEET ABOUT OPTICAL TECHNOLOGY

Imagine, development and production costs, as well as time to market, for passive optical components and modules reduced by 60%. Luna's OVA-EL completely characterizes passive optical components and assemblies with breakthrough speed, all with a single sweep of an external tunable laser source.

MEASUREMENTS:

Insertion Loss (IL)

Return Loss (RL)

Polarization Dependent Loss (PDL)

Phase response

Group Delay (GD)

Chromatic Dispersion (CD)

Polarization Mode Dispersion (PMD)

2nd order Polarization Mode Dispersion (PMD)

Min/Max Loss due to Polarization

Impulse response

Jones matrix elements

Phase Ripple - Linear and Quadratic

ADVANTAGES:

The OVA EL offers significant advantages for optical component testing in the following categories.

• Productivity
  The OVA EL eliminates manufacturing bottlenecks and reduces labor cost by providing comprehensive component characterization over 40 nm in less than 2.5 seconds. Equivalent testing using currently available equipment can take 10x longer.
• Capital investment reduction
  The OVA EL provides comprehensive analysis in a single instrument. There is no need to have multiple, expensive instruments for complete analysis.
• Ease of use
  The OVA EL is fully automated, requiring no special skills to operate. It can be easily integrated into a manufacturing production line.
• Space savings
  The OVA EL is a single unit that fits into one rack space, providing the same functionality as multiple-instrument configurations.
• Modularity
  Make greater use of your tunable laser source.