Date

Event

March 9-13, 2008

Smart Structure 2008
San Diego, CA
Luna Technologies will be exhibiting booth No. 209

40-100 Gigahertz Economical Testing for Full Characterization of 1 Port to Multi-port Optical Components and Sub-assemblies

Breakthrough Precision Reflectometry Testing with 70dB Dynamic Range and 130dB sensitivity, "See What You Have Been Missing"

Optical component and module testing to ensure operability in the 40G network -live audio and video

Optical component and module testing to ensure operability in the 40G network -live audio and video

New optical test methods for 99.99% uptime networks - live audio and video

Combining Component Characterization and Simulation to Enable the Next Generation Optical Network, a joint webinar with RSoft Incorporated (slides only)
Click to Download Archive Presentation

New Rayleigh-Based Technique for Very High Resolution Distributed Temperature and Strain Sensing (slides only)
Click to Download Archive Presentation