Overview of optical vector network analyzer for single scan
measurements of loss, group delay and polarization
mode dispersion (PDF)
A white paper describing the Optical Vector Analyzer
Optical vector analysis integrates component
testing - Lightwave (HTML)
Introduction to optical vector analysis
and it’s
applications in optical component testing.
Interferometric measurement of dispersion (PDF)
Introduction to
using interferometry to measure dispersion in optical components.
Linear Systems Approach to Characterizing Components (PDF)
Introduction
to component characterization using linear systems theory.
Interferometric instrumentation combined with linear systems
theory yields BER modeling from component measurement (PDF)
Short introduction to how Optical Vector Analysis
can be used to predict component performance based
on eye-diagram and power penalty simulations.
Second Order PMD in Optical Components (PDF)
Introduction to measuring second order polarization
mode dispersion in optical components (SOPMD)
Characterization of femtosecond first and second-order PMD (PDF)
A comparison of measurement results for SOPMD using
Optical Vector Analysis
Optical vector network analyzer for single-scan
measurements of loss, group delay, and
polarization mode dispersion as appeared in Applied Optics (PDF)
Overview of method and theory behind the optical vector network analyzer's ability to complete single-scan
measurements of loss, group delay, and
polarization mode dispersion
Characterizing the optical properties of planar waveguides, optical chips and planar light circuits (HTML)
An application note discussing optical vector analysis's distinct measurement advantages that make it particularly well suited for characterization and analysis of planar waveguides and circuits.